Our Suppliers
Our Suppliers
Partnerships are formed only after thorough hands-on evaluation, with a single standard: uncompromising measurement quality.
Scroll down to view our Portfolio.
Partnerships are formed only after thorough hands-on evaluation, with a single standard: uncompromising measurement quality. Scroll down to view our Portfolio.
Chimera Technology partnership with EOULU is the obvious choice when it comes to on-wafer semiconductor test. It is the worlds only provider that offers probe station, probes, instrumentation and test executive software at the lowest cost of test.
Chimera Technology partnership with EOULU is the obvious choice when it comes to on-wafer semiconductor test. It is the worlds only provider that offers probe station, probes, instrumentation and test executive software at the lowest cost of test.
EOULU's portfolio of products are highlighted below, that when combined together offers solutions to all of your probing challenges.
EOULU's portfolio of products are highlighted below, that when combined together offers solutions to all of your probing challenges.
EOULU's portfolio of products are highlighted below, that when combined together offers solutions to all of your probing challenges.
PRODUCTS
On-wafer Probe Stations
On-wafer
Probe Stations
On-wafer Probe Stations
A all-in-one System platoform that offers - 150mm-300mm. Manual, Semi-automatic, Fully-automatic. Thermal from -60 to 300 degC. Applications covering RF to 500GHz, DC Parametric, High Power, 1/f and more.
PRODUCTS
Probes
Probes
Probes
A broad range of probes such as DC parametric, RF Probes to 500GHz, RF/DC Probe Cards and High Power Probe Cards and Probes - covering all probing requirements from R&D to Production.
A broad range of probes such as DC parametric, RF Probes to 500GHz, RF/DC Probe Cards and High Power Probe Cards and Probes - covering all probing requirements from R&D to Production.
PRODUCTS
Test & Measurement
Software
Test & Measurement
Software
Test & Measurement
Software
Software solutions including Future I for probe station control, Future Cal to manage on-wafer S-parameter calibration, Future C as a test executuive to integrate instrument and prober to Future D for large scale data management and reporting
Software solutions including Future I for probe station control, Future Cal to manage on-wafer S-parameter calibration, Future C as a test executuive to integrate instrument and prober to Future D for large scale data management and reporting
© 2025 Chimera Technology s.r.o.
All rights reserved
© 2025 Chimera Technology s.r.o.
All rights reserved
© 2025 Chimera Technology s.r.o.
All rights reserved